Atomic force microscopes require training and education for optimal use. Without proper theoretical and operational training, users can run into frustration and problems with the AFM even if the issue is easily resolved.
Atomic Force Microscopy by Paul West and Peter Eaton and published by Oxford University Publishing, is an introduction into the theory, design, operation, and application of AFMs.
Atomic Force Microscopes and AFM Systems manufactured by AFMWorkshop are designed with the essential scanning features for obtaining high-quality AFM images at high resolution, along with a flexible scanning software developed in LabVIEW.
AFMWorkshop has a broad range of atomic force microscopes, all covered by the money-back guarantees. They believe in customer satisfaction and provide 100% satisfaction guarantee.