AFMWorkshop - Provides Materials For Afm Training And Education


Posted June 24, 2020 by AFMWorkshop

Atomic Force Microscopy by Paul West and Peter Eaton and published by Oxford University Publishing, is an introduction into the theory, design, operation, and application of AFMs.

 
Atomic Force Microscopy, written by Peter Eaton, PhD and Paul West, PhD, and published by Oxford University Press, is an essential introduction to atomic force microscope theory and practice, principles and application.

Atomic Force Microscopy from Oxford University Press: An overview!

Atomic force microscopy is an amazing technique that allies a versatile methodology (allowing measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques: it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution.

This book will provide fundamentals of Atomic Force Microscopy, demystify AFM for the reader, making it easy to understand and easy to use. It is written by authors who have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

A very practical guide to Atomic Force Microscopy
Authors have unique insight into the field
Combination in one book of AFM theory, principles, practice, techniques and application of AFM
Very up-to-date with latest techniques such as multifrequency AFM, high speed AFM, small cantilevers, etc.
Insight on how instrumental design influences performance, and instrument use
Section on how to recognise, and avoid, AFM artifacts
Examples of AFM application in physical sciences, materials science, life sciences, nanotechnology and industry.

Readership: Industrial users of Atomic Force Microscopy. University researchers using AFM (students in undergraduate and postgraduate degrees, and post doctoral researchers and professors). Both teachers and students in courses involving AFM, especially nanotechnology courses.

Table of Contents:

Chapter 1: Introduction
Chapter 2: Instrumental Aspects of AFM
Chapter 3: AFM Modes
Chapter 4: Measuring AFM Images
Chapter 5: Image Processing in AFM
Chapter 6: Image Artifacts in AFM
Chapter 7: Applications of AFM

Appendix A: AFM Standards
Appendix B: Scanner Calibration and Certification Procedures
Appendix C: Third Party AFM Software Index

Readership: Industrial users of Atomic Force Microscopy. University researchers using AFM (students in undergraduate and postgraduate degrees, and post-doctoral researchers and professors). Both teachers and students in courses involving AFM, especially nanotechnology, nanoscience courses.

About AFMWorkshop
AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications.

To learn more about our atomic force microscopes, feel free to visit www.afmworkshop.com.
 
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Tags afm , afmworkshop , atomic force microscope , atomic force microscopes , atomic force microscopy
Last Updated June 24, 2020