Today’s scientific and engineering research and development mainly lies in the realm of nanotechnology, such as manipulation, imaging, fabrication, and application of systems at the nanometer scale. To maintain the momentum of this nanotechnology-oriented scientific progression, a significant tool such as global focused ion beam (FIB) market is needed to successfully combat all the challenges and fulfill all the promises of the future of nanoscience.


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Focused ion beam instruments have both micromachining and high-level imaging capabilities at the nanometer-micrometer scale, and are thus popularly used in materials science and the semiconductors industry. They are now increasingly being used in the biological field for ablation of materials, deposition, and site-specific analysis. While the broad majority of FIB systems are mostly used for semiconductor applications, recent years have witnessed a marked increase in the overall use of FIB tools in the field of materials science.

Focused Ion Beam System Used as a Leading Materials Science Tool

FIB systems are a vital tool used for manipulating and operating various materials and their structures at the nanoscale level. The field of materials science perpetually seeks imaging and analysis on a minute scale to gain an in-depth understanding of the materials, composition, structure, and processing. Such precision and material fabrication is achieved with the help of FIB systems.

A focused ion beam system presents imaging capabilities similar to those of a scanning electron microscope (SEM). FIB systems coupled with SEM are most commonly used to set up samples for TEM or transmission electron microscopes. Focused ion beam systems have become imperative to the progress of materials science and many other fields that depend on nanotechnology. Hence, the FIB market is estimated to reach an estimated value of US$4,624 million by 2021, growing at a CAGR of 7.4% until 2021, reports a leading market firm in the U.S.

Focused ion beam microscopy is increasingly being implemented in a wide range of materials science applications, such as the generation of 3D visualization, specimen preparation, prototype nanomachining, microstructural analysis, and circuit editing.

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Fastest Growing Areas of Application for FIB-SEM

Until recently, 3D imaging and materials analysis via FIB-SEM was one of the most basic processes to analyze the structure and composition of a material. During the past few years, 3D FIB-SEM analysis has been implemented in many other disciplines such as geology, life sciences, and fuel cell applications. FIB-SEM also finds use in six other areas of applications. They are:
Device Modification
Materials Science
Circuit Edit
Failure Analysis
Nanofabrication
Others (including biological science)
Among the aforementioned, the circuit edit application held the largest share of the FIB market in 2014. Focused ion beam circuit edits help cut specific traces of materials or add metal connections within a chip. Circuit edits utilize fine gallium ions to image, etch, and deposit the materials on integrated circuits.

Advances in Ion Sources

At present, most of the focused ion beam instruments are prepared with liquid metal ion source (LMIS), which emits gallium ions. This is one of the most significant developments in the field. Gallium ion source held the largest share in the global FIB market in 2014, accounting for 39.6% of the market.

Gallium LMIS FIB technology is currently robust in the global market. It offers the advantages of a long source lifetime and high mass ions for rapid machining.

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