NEOSEMITECH CO., LTD. is a smart factory-based company specialized in IoT, ICT application technology. The Semiconductor Measuring Equipment is its main product that consists of Smart Multi Sensing Technology (SMST) Series of products, and semiconductor facilities such as the Analog-Digital Converter (ADC) and the Ion Decay Time Analyzer.

Based on its advanced research facilities, excellent research personnel, abundant experience, and accumulated technology, NEO SEMITECH promises to continue to do its best to develop new technologies and products in the semiconductor and electronics industries and to be a trusted partner to its customers all over the world. Its excellent solutions ensure all the customers with top-quality products.

NEO SEMITECH’s products will help maintain optimal production conditions, which will reduce the loss rate due to equipment errors so as to increase productivity to make the best production activities for customers.

NEO SEMITECH SMST-8400
It is the multi-purpose monitoring equipment with the compact and light design that allows a maximum of 40 channels. It assures stable operation by measuring diverse data of installation in terms of temperature, vibration, voltage, and a number of revolutions and in-turn real-time transmission to the manager via wire/wireless communication.

 Use data collected through various sensors to reduce deviations between equipment to improve production quality
 Alarm can be sent through advance detection of abnormal conditions of the equipment, and actions can be taken before system failure or defect occurs
 Real-Time Data Resource System
 Connected management of other systems (MES, FDC, SPC) to improve product quality
 Customer Quality Satisfaction, Manufacturing Competitiveness
 Depending on the communication environment, wired and wireless communication can be used

NEO SEMITECH Analog-Digital Converter
It maximizes production efficiency by collecting, analyzing, and optimizing information based on sensors, and secures the field data related to reliability including performance, life, and failure rate of the equipment.

 To optimize the information collected and accumulated through sensors
 To simplify the production schedule
 To collect and analyze data from different types of sensors
 To improve manufacturing process efficiency by predicting equipment failure in advance
 To obtain field data on the reliability and reliability of equipment performance, lifespan, failure rate, etc.

NEO SEMITECH ION DECAY TIME
It inspects and measures the performance of the Ion Blower to remove static electricity occurring during semiconductor production, and its small size allows unrestricted measure points and simultaneous measurement of temperature and humidity.